Probe Adjuster IV Chip Contact Test Bench Current Probe Fixture W/ Magnetic Base

Probe Adjuster IV Chip Contact Test Bench Current Probe Fixture W/ Magnetic Base

Probe Adjuster IV Chip Contact Test Bench Current Probe Fixture Fine Adjustment Probe Experiment Sliding Stage + Magnetic Base\nApplication:Mainly used in the semiconductor industry, optoelectronic industry, integrated circuits and packaging, research and development of precision electrical measurement of complex, high-speed devices, to ensure quality and reliability, and to reduce the cost of development time and device manufacturing processApplicable to fabs, research institutes, universities, etc. for IGBT, FRD, voltage and current testing, solar cell testing, diode transistor testing, back electrode testing\nFeature:The probe adjustment seat is divided into a three-dimensional adjustment seat, a probe armMagnetic adsorption floor compositionThree-dimensional adjustment seat can realize XYZ direction adjustmentProbe arm probe installation: vertical, 45\u00B0Magnetic adsorption base is easy to adjust and fixSuitable for subtle work with low operating frequency\nSpecification:Name: e

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