Scanning Nonlinear Dielectric Microscopy Cho Paperback Woodhead Publishing

Scanning Nonlinear Dielectric MicroscopyInvestigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices\nAuthor(s): Yasuo Cho\nFormat: Paperback\nPublisher: Elsevier Science Publishing Co Inc, United States\nImprint: Woodhead Publishing\nISBN-13: 9780128172469, 978-0128172469\nSynopsis\nScanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book.