Thermal-Aware Testing of Digital VLSI Circuits and Systems
CRC Press
Thermal-Aware Testing of Digital VLSI Circuits and SystemsAuthor(s): Santanu Chattopadhyay\nFormat: Paperback\nPublisher: Taylor & Francis Ltd, United Kingdom\nImprint: CRC Press\nISBN-13: 9780367607098, 978-0367607098\nSynopsis\nThis book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level\n\nDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques\n\nThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
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