Statistical Analysis and Modelling of Spatial Point Patterns ... - 9780470014912

Statistical Analysis and Modelling of Spatial Point PatternsAuthor(s): Janine Illian, Antti Penttinen, Helga Stoyan, Dietrich Stoyan\nFormat: Hardback\nPublisher: John Wiley & Sons Inc, United States\nImprint: Wiley-Interscience\nISBN-13: 9780470014912, 978-0470014912\nSynopsis\nSpatial point processes are mathematical models used to describe and analyse the geometrical structure of patterns formed by objects that are irregularly or randomly distributed in one-, two- or three-dimensional space. Examples include locations of trees in a forest, blood particles on a glass plate, galaxies in the universe, and particle centres in samples of material. Numerous aspects of the nature of a specific spatial point pattern may be described using the appropriate statistical methods. Statistical Analysis and Modelling of Spatial Point Patterns provides a practical guide to the use of these specialised methods. The application-oriented approach helps demonstrate the benefits of this increasing.