Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF an

Measurement Techniques for Radio Frequency NanoelectronicsAuthor(s): T. Mitch Wallis, Pavel Kabos\nFormat: Hardback\nPublisher: Cambridge University Press, United Kingdom\nImprint: Cambridge University Press\nISBN-13: 9781107120686, 978-1107120686\nSynopsis\nConnect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale .