Machine Vision Inspection Systems: Image Proces, Malarvel, Nayak, Panda, Pat^+

Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and ApplicationsAuthor(s): Muthukumaran Malarvel, Soumya Ranjan Nayak, Surya Narayan Panda, Prasant Kumar Pattnaik, Nittaya Muangnak\nFormat: Hardback\nPublisher: John Wiley & Sons Inc, United States\nImprint: Wiley-Scrivener\nISBN-13: 9781119681809, 978-1119681809\nSynopsis\nThis edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier interdisciplinary platform to present and discuss the most recent innovations, trends, methodology, applications, and concerns as well as practical challenges encountered and solutions adopted in the inspection system in terms of image processing and analytics of machine vision for real and industrial application.\n\n Machine vision inspection sys.