Scanning Electron Microscopy and X-Ray Microanalysis - 9781493982691

Scanning Electron Microscopy and X-Ray MicroanalysisAuthor(s): Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy\nFormat: Paperback\nPublisher: Springer-Verlag New York Inc., United States\nImprint: Springer-Verlag New York Inc.\nISBN-13: 9781493982691, 978-1493982691\nSynopsis\nThis thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners engineers, technicians, physical and biological scientists, clinicians, and technical managers will find that every chapter has been overhauled to m3