Progress in Nanoscale Characterization and Mani. Wang, Wang, Zhang<|

Progress in Nanoscale Characterization and ManipulationAuthor(s): Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai\nFormat: Hardback\nPublisher: Springer Verlag, Singapore, Singapore\nImprint: Springer Verlag, Singapore\nISBN-13: 9789811304538, 978-9811304538\nSynopsis\nThis book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.\nThe book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spher.