Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray ...

Name: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray ...
Brand: Springer-Verlag New York Inc.

Springer-Verlag New York Inc.

Unlock the secrets of Scanning Electron Microscopy (SEM) and X-ray microanalysis with this comprehensive handbook. Designed for researchers and scientists, it details essential sample preparation techniques to ensure optimal imaging and accurate chemical analysis. Learn how to prepare diverse specimens, from conductive to non-conductive materials, for high-vacuum environments. Understand the principles behind signal generation and collection for both imaging and analysis. This guide is crucial for anyone working with SEM and X-ray microanalysis, enabling you to achieve high-quality magnified images and precise in-situ chemical information. Key Features: * Comprehensive guide to sample preparation for SEM and X-ray microanalysis * Covers techniques for various specimen types * Explains principles of imaging and analytical systems * Essential for researchers and scientists in materials science and related fields Summary: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin. This hardcover book, written in English, provides 332 pages of detailed information on preparing samples for advanced microscopy and analysis, featuring 159 color illustrations. ISBN 9780387857305.