Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693

Name: Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Brand: Joseph Goldstein

Joseph Goldstein

Master the complexities of Scanning Electron Microscopy (SEM) and X-ray microanalysis with this comprehensive third edition. Designed for both students and industry practitioners, this text offers a deep dive into the practical applications of SEM technology. The content explores essential functions of scanning electron microscopes and spectrometers, providing clear guidance on both qualitative and quantitative X-ray analysis. The book includes specialized chapters on sample preparation techniques for diverse materials, ranging from polymers and biological specimens to hard materials. Readers will also find detailed methodologies for eliminating charging issues in non-conducting specimens. This authoritative resource is an essential guide for those looking to enhance their technical proficiency in materials analysis and microscopy. Joseph Goldstein Scanning Electron Microscopy & X-Ray Microanalysis Third Edition covers SEM instrumentation, X-ray spectroscopy, sample preparation for biological and hard materials, and quantitative microanalysis techniques.